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Tag Archives: Aprel EM-ISight

Aprel EM-ISight EMI Scanning System First to Probe 20GHz!

The innovative engineers at Aprel have announced that the popular EM-ISight EMI scanning system is now upgradeable to 20GHz, utilizing a single probe solution. The specifics of the upgrade involve upgrading the system software, additional probe calibrations and a new micro Stripline for self calibrating and verifying the system. This upgrade makes Aprel the only […]

Aprel EM-ISight – Electromagnetic Interference (EMI) Scanning System

Aprel is a pioneer in the design of fully automated electromagnetic noise scanning test solutions. The EM-ISight EMI Scanner has been developed as a fully automatic system for detecting the sources of electromagnetic interference (EMI) and RF noise emitted by electronic devices and their respective circuits. The EM-ISight system enables design & quality assurance QA […]